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Paper ID: 2961

Meeting the Design Challenges of nano-CMOS Electronics
C.,Millar A.,Asenov G.,Roy S.,Roy D.,Cumming D.,Berry S.,Pickles S.,Furber A.,Murray A.,Tyrell M.,Zwolinski R.O.,Sinnott

Appeared in: Proceedings of Design Automation and Test in Europe: Workshop on Impact Process Variability on Design and Test, Munich, Germany March 2008
Page Numbers:
Publisher: N/A
Year: 2000
ISBN/ISSN:
Contributing Organisation(s):
Field of Science: Engineering

URL:

Abstract:

Keywords:


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Last Updated: 22 Jun 12 11:02
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